Table of Contents
ISRN Optics
Volume 2012, Article ID 859353, 23 pages
http://dx.doi.org/10.5402/2012/859353
Review Article

Advanced Nanomeasuring Techniques for Surface Characterization

Engineering and Surface Metrology Department, Length and Precision Engineering Division, National Institute for Standards (NIS), Giza 12211-136, Egypt

Received 26 August 2012; Accepted 18 October 2012

Academic Editors: L. Carretero, O. Frazão, H. Matsumoto, and A. E. Miroshnichenko

Copyright © 2012 Salah H. R. Ali. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Salah H. R. Ali, “Advanced Nanomeasuring Techniques for Surface Characterization,” ISRN Optics, vol. 2012, Article ID 859353, 23 pages, 2012. https://doi.org/10.5402/2012/859353.