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Journal of Applied Mathematics
Volume 2013, Article ID 414120, 9 pages
Research Article

Handing Tolerance Problem in Fault Diagnosis of Linear-Analogue Circuits with Accurate Statistics Approach

School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu 611731, China

Received 8 May 2013; Revised 10 October 2013; Accepted 15 October 2013

Academic Editor: Li Weili

Copyright © 2013 Xin Gao et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Citations to this Article [1 citation]

The following is the list of published articles that have cited the current article.

  • Hongzhi Hu, Shulin Tian, and Qing Guo, “Fault Modeling and Testing for Analog Circuits in Complex Space Based on Supply Current and Output Voltage,” Journal of Applied Mathematics, vol. 2015, pp. 1–9, 2015. View at Publisher · View at Google Scholar