Optical Response Near the Soft X-Ray Absorption Edges and Structural Studies of Low Optical Contrast System Using Soft X-Ray Resonant Reflectivity

<table>Simulated XRR profile (at 8047 eV) of B<sub>4</sub>C (60 nm) thin film with a 1.3 nm porous B<sub>4</sub>C layer with different porosity at the bottom of the film.</table>

Journal of Atomic and Molecular Physics

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Figure 12

Figure 12: Optical Response Near the Soft X-Ray Absorption Edges and Structural Studies of Low Optical Contrast System Using Soft X-Ray Resonant Reflectivity 

Figure 12 | Optical Response Near the Soft X-Ray Absorption Edges and Structural Studies of Low Optical Contrast System Using Soft X-Ray Resonant Reflectivity 