Table of Contents
Journal of Crystallography
Volume 2016, Article ID 4351347, 11 pages
Research Article

Finite Element Simulation and X-Ray Microdiffraction Study of Strain Partitioning in a Layered Nanocomposite

1Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
2Mechanical Science and Engineering Department, University of Illinois at Urbana-Champaign, Urbana, IL 61801, USA
3National Center for Supercomputing Applications, University of Illinois at Urbana-Champaign, Urbana, IL 61801, USA
4Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439, USA

Received 28 February 2016; Accepted 4 May 2016

Academic Editor: Laszlo Toth

Copyright © 2016 R. I. Barabash et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


The depth-dependent strain partitioning across the interfaces in the growth direction of the NiAl/Cr(Mo) nanocomposite between the Cr and NiAl lamellae was directly measured experimentally and simulated using a finite element method (FEM). Depth-resolved X-ray microdiffraction demonstrated that in the as-grown state both Cr and NiAl lamellae grow along the direction with the formation of as-grown distinct residual ~0.16% compressive strains for Cr lamellae and ~0.05% tensile strains for NiAl lamellae. Three-dimensional simulations were carried out using an implicit FEM. First simulation was designed to study residual strains in the composite due to cooling resulting in formation of crystals. Strains in the growth direction were computed and compared to those obtained from the microdiffraction experiments. Second simulation was conducted to understand the combined strains resulting from cooling and mechanical indentation of the composite. Numerical results in the growth direction of crystal were compared to experimental results confirming the experimentally observed trends.