Research Article

Parametric Yield-Driven Resource Binding in High-Level Synthesis with Multi-Vth/Vdd Library and Device Sizing

Figure 10

Leakage power characterization of function units with multi- 𝑉 t h / 𝑉 d d and variation awareness.
105250.fig.0010a
(a) 𝑉 t h = 0 . 3 7 V
105250.fig.0010b
(b) 𝑉 t h = 0 . 5 6 V