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Journal of Electrical and Computer Engineering
Volume 2014, Article ID 309193, 14 pages
Research Article

Applying the Analog Configurability Test Approach in a Wireless Sensor Network Application

1Communication Laboratory, Engineering Faculty, Universidad Católica de Córdoba, Avenida Armada Argentina 3555, 5017 Córdoba, Argentina
2Mechatronics Research Group, Facultad Regional Villa María, Universidad Tecnológica Nacional, Avenida Universidad 450, 5900 Villa María, Argentina

Received 17 September 2013; Accepted 25 December 2013; Published 11 February 2014

Academic Editor: Mohamad Sawan

Copyright © 2014 Agustín Laprovitta et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


This work addresses the application of the analog configurability test (ACT) approach for an embedded analog configurable circuit (EACC), composed of operational amplifiers and interconnection resources that are embedded in the MSP430xG461x microcontrollers family. This test strategy is particularly useful for in-field application requiring reliability, safe operation, or fault tolerance characteristics. Our test proposal consists of programming a reduced set of available configurations for the EACC and testing its functionality by measuring only a few key parameters. The processor executes an embedded test routine that sequentially programs selected configurations, sets the test stimulus, acquires data from the internal ADC, and performs required calculations. The test approach is experimentally evaluated using an embedded system-based real application board. Our experimental results show very good repeatability, with very low errors. These results show that the ACT proposed here is useful for testing the functionality of the circuit under test in a real application context by using a simple strategy at a very low cost.