Research Article
Programmed Tool for Quantifying Reliability and Its Application in Designing Circuit Systems
Table 2
Reliability measures, time execution, and storage complexity for standard benchmark test circuits with
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| Test circuit | Number of faulty gates | Model | Reliability | Time (s) | Storage (bytes) |
| Full adder | 5 | PGM | 0.7879 | 4.46 | 1962 | BDEC | 0.7875 | 0.61 | 802 | PTM | 0.7997 | 6.56 | 173872 | BN | 0.8869 | 3.33 | 108654 |
| 2–4 decoder | 6 | PGM | 0.7397 | 1.55 | 1836 | BDEC | 0.7405 | 0.69 | 1260 | PTM | 0.7566 | 41.38 | 1201826 | BN | 0.9166 | 6.18 | 131642 |
| C17 | 6 | PGM | 0.7621 | 9.10 | 7088 | BDEC | 0.7634 | 0.55 | 1096 | PTM | 0.7839 | 6.27 | 142102 | BN | 0.8816 | 3.13 | 139456 |
| NAND based full adder | 12 | PGM | 0.5933 | 4.16 | 3348 | BDEC | 0.6326 | 0.88 | 2188 | PTM | 0.6605 | 11.33 | 327268 | BN | 0.7809 | 4.13 | 227444 |
| Majority gates based full adder | 28 | PGM | 0.5767 | 8.27 | 9460 | BDEC | 0.6274 | 1.94 | 8300 | PTM | Storage complexity increases result in “busy” mode | BN | 0.7560 | 7.55 | 594548 |
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