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Journal of Electrical and Computer Engineering
Volume 2015, Article ID 630178, 14 pages
http://dx.doi.org/10.1155/2015/630178
Research Article

Impact of Interface Traps on Direct and Alternating Current in Tunneling Field-Effect Transistors

School of Microelectronics, Xidian University, Xi’an 710071, China

Received 6 May 2015; Revised 5 August 2015; Accepted 12 August 2015

Academic Editor: Muhammad Taher Abuelma’atti

Copyright © 2015 Zhi Jiang et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Zhi Jiang, Yiqi Zhuang, Cong Li, Ping Wang, and Yuqi Liu, “Impact of Interface Traps on Direct and Alternating Current in Tunneling Field-Effect Transistors,” Journal of Electrical and Computer Engineering, vol. 2015, Article ID 630178, 14 pages, 2015. https://doi.org/10.1155/2015/630178.