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Advances in Deep Learning for Pattern Recognition

Call for Papers

Pattern recognition has been a rapidly expanding discipline in the past decade. Pattern analysis has applications in many areas, including character recognition, remote sensing, target tracking, biomedical image analysis, fingerprint analysis, industrial automation, and robotics. Nowadays, deep learning, which can be treated as the most significant breakthrough in the field of pattern recognition and machine learning, has greatly affected the methodology of related fields like pattern classification and regression in both academia and industry.

In this special issue, the main aim is to publish high-quality research papers that report the results of pattern recognition and image processing. This issue is also open for review articles addressing and summarizing the recent state of understanding the concepts on pattern recognition and image processing and applications. Original, high-quality contributions that are not yet published or that are not currently under review by other journals or peer-reviewed conferences are welcome.

Potential topics include but are not limited to the following:

  • Deep learning for computer vision
  • Deep learning for classification and regression
  • Deep learning for character recognition
  • Deep learning architecture for pattern recognition
  • Optimization for deep learning
  • Deep learning for text recognition
  • Deep learning for face analysis
  • Deep learning for speech recognition
  • Deep learning for medical image recognition

Authors can submit their manuscripts through the Manuscript Tracking System at https://mts.hindawi.com/submit/journals/jece/signal.processing/pripa/.

Submission DeadlineFriday, 1 June 2018
Publication DateOctober 2018

Papers are published upon acceptance, regardless of the Special Issue publication date.

Lead Guest Editor

  • Hai Guo, Dalian Nationalities University, Dalian, China

Guest Editors