Research Article

Accurate Rapid Lifetime Determination on Time-Gated FLIM Microscopy with Optical Sectioning

Figure 2

Accuracy error of the fluorescence lifetime calculated by the RLD technique without and with IRF deconvolution for different values of nominal fluorescence lifetime. The simulations were done considering a gate width of 1000 ps and a laser power level of 90%. The accuracy errors are presented as percentage of the nominal lifetimes.