Table of Contents
Journal of Materials
Volume 2013, Article ID 678361, 20 pages
http://dx.doi.org/10.1155/2013/678361
Review Article

Recent Developments in the X-Ray Reflectivity Analysis for Rough Surfaces and Interfaces of Multilayered Thin Film Materials

Center for Supports to Research and Education Activities, Kobe University, Kobe 657-8501, Japan

Received 31 December 2012; Revised 6 June 2013; Accepted 24 June 2013

Academic Editor: Te-Hua Fang

Copyright © 2013 Yoshikazu Fujii. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Yoshikazu Fujii, “Recent Developments in the X-Ray Reflectivity Analysis for Rough Surfaces and Interfaces of Multilayered Thin Film Materials,” Journal of Materials, vol. 2013, Article ID 678361, 20 pages, 2013. https://doi.org/10.1155/2013/678361.