Fabrication of Thermoelectric Sensor and Cooling Devices Based on Elaborated Bismuth-Telluride Alloy Thin Films

Table 1

X-ray diffraction data for Bi₂Te₃ and standard pattern; hkil indices are referred to hexagonal structure cell.

(hkil)	References [2, 12]		Our results
	𝑑 (Å)	𝐼/𝐼0	𝑑 (Å)	𝐼/𝐼0
(0006)	5.078	8	5.012	98
(00105)	3.220	100	3.192	17
(00015)	2.032	40	2.017	100
(00018)	1.694	5	1.685	21
(02010)	1.610	16	1.605	11