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Journal of Materials
Volume 2015 (2015), Article ID 215210, 8 pages
Research Article

Rutherford Backscattering Spectrometry Analysis and Structural Properties of Thin Films Deposited by Chemical Spray Pyrolysis

1Engineering Materials Development Institute, Akure 340223, Nigeria
2Center for Energy Research and Development, Obafemi Awolowo University, Ile-Ife 220005, Nigeria
3Department of Physics and Engineering Physics, Obafemi Awolowo University, Ile-Ife 220005, Nigeria

Received 8 June 2015; Revised 11 August 2015; Accepted 11 August 2015

Academic Editor: Rodrigo Martins

Copyright © 2015 Abiodun E. Adeoye et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


Zinc lead sulphide ternary thin films were prepared by chemical spray pyrolysis on soda lime glass substrates using zinc acetate, lead acetate, and thiourea sources precursor. The films were characterized using Rutherford backscattering (RBS) spectrometry, energy dispersive X-ray (EDX) spectroscopy, scanning electron microscopy (SEM), and X-ray diffractometry (XRD). RBS studies revealed variation in thickness and stoichiometry of the films with respect to compositional substitution between Zn and Pb, thereby giving effective composition , where , 0.035, 0.069, 0.109, 0.176, and 0.217. Film thickness obtained by length conversion ranged from 81.02 nm to 90.03 nm. Microstructural analyses also indicated that the growth and particle distribution of the films were uniform across substrate’s surface. Diffraction studies showed that the films possess FCC crystalline structure. Crystallite size reduced from 14.28 to 9.8 nm with increase in Zn2+ in the samples.