Journal of Materials / 2015 / Article / Tab 4

Research Article

Rutherford Backscattering Spectrometry Analysis and Structural Properties of Thin Films Deposited by Chemical Spray Pyrolysis

Table 4

Computed crystals size and the lattice constants for thin film samples.

SampleLattice constant (Å)Crystal size using Scherer’s formula (nm)Crystal size using modified Scherer’s formula (nm)Residual strain

ZPS15.942 14153.125 × 10−3
ZPS25.952 13133.22 × 10−3
ZPS35.961 12133.85 × 10−3
ZPS45.973 12125.75 × 10−3
ZPS55.989 11116.70 × 10−3
ZPS65.995 10107.00 × 10−3