Pressure and Temperature Effects on Stoichiometry and Microstructure of Nitrogen-Rich TiN Thin Films Synthesized via Reactive Magnetron DC-Sputtering

Figure 7

SEM images of increasing 𝑃_𝑃 at 𝑇_𝑆 = 400^∘C. with a) 0.26 𝑃𝑎, b) 0.53 𝑃𝑎, c) 1.07 𝑃𝑎 and d) 1.60 𝑃𝑎

(a)

(b)

(c)

(d)