Templated Fabrication of InSb Nanowires for Nanoelectronics
Figure 3
(a) Electron transparent edge of an InSb nanowire in a TEM bright field image, (b) selected area diffraction
pattern (SAED) shows hexagonal pattern on a (0-2-2) zone axis, and (c) high-resolution TEM image of the junction between an atomically abrupt
inter-twinning. The arrows are showing the junctions.
