Crystallographically Oriented Nanorods and Nanowires of RF-Magnetron-Sputtered Zinc Oxide

Table 1

Ellipsometric data of n, k, and d for the thin films of ZnO.

Substrate	Refractive index (𝑛)	Extinction coefficient (𝑘)	Film thickness (𝑑)
Silicon	1.41 ± 0.01	0.005 ± 0.001	585 ± 0.5 nm
	1.41 ± 0.01	0.005 ± 0.001	582 ± 0.7 nm
Quartz	2.405 ± 0.004	0.002 ± 0.001	104 ± 0.5 nm