Journal of Nanomaterials / 2009 / Article / Fig 7

Research Article

Origin of the Difference in the Resistivity of As-Grown Focused-Ion- and Focused-Electron-Beam-Induced Pt Nanodeposits

Figure 7

HRTEM images obtained out of lamellae fabricated respectively from a Pt nanodeposit by (a) FIBID and (b) FEBID, in both cases grown at 5 kV beam energy.
936863.fig.007a
(a) FIBID Pt deposit
936863.fig.007b
(b) FEBID Pt deposit

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