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Journal of Nanomaterials
Volume 2012 (2012), Article ID 123438, 7 pages
http://dx.doi.org/10.1155/2012/123438
Research Article

Electronic Structure of BiFe1−xMnxO3 Thin Films Investigated by X-Ray Absorption Spectroscopy

1Beijing Synchrotron Radiation Facility, Institute of High Energy Physics, CAS, Beijing 100049, China
2School of Physical Science and Technology, Xinjiang University, Urumqi 830046, China

Received 7 March 2012; Accepted 21 April 2012

Academic Editor: Weichang Hao

Copyright © 2012 Abduleziz Ablat et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Abduleziz Ablat, Emin Muhemmed, Cheng Si, et al., “Electronic Structure of BiFe1−xMnxO3 Thin Films Investigated by X-Ray Absorption Spectroscopy,” Journal of Nanomaterials, vol. 2012, Article ID 123438, 7 pages, 2012. doi:10.1155/2012/123438