Dielectric Relaxation of Lanthanide-Based Ternary Oxides: Physical and Mathematical Models

Figure 4

k-f data taken from the measurement C-f curves of La_𝑥Zr_1−𝑥O₂ thin films. The square symbols are measured from La_0.09Zr_0.91O₂, and the solid line is modeled according to the HN law. The diamond symbols, triangle symbols, and circle symbols are tested, respectively, from the La_𝑥Zr_1−𝑥O₂ with doping levels of 22%, 35%, and 63%, and solid lines in these cases are all simulated using the CS law. The parameters of CS and HN laws (𝛼, 𝜏, and 𝑛) are shown in brackets.