Research Article

Influence of Annealing and UV Irradiation on Hydrophilicity of Ag- T i O 𝟐 Nanostructured Thin Films

Figure 3

AFM images of Ag-TiO2 films on silicon substrate (a) as-deposited and annealed at 900Β°C for (b) 15, (c) 30, (d) 60, (e) 90, and (f) 120 min.
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(a)
310514.fig.003b
(b)
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(c)
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(d)
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(e)
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(f)