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Journal of Nanomaterials
Volume 2013, Article ID 381519, 9 pages
Research Article

A Grazing-Incidence Small-Angle X-Ray Scattering View of Vertically Aligned ZnO Nanowires

1Department of Physics, Faculty of Chemistry and Technology, University of Split, Teslina 10, 21000 Split, Croatia
2Division of Materials Physics, Division of Laser and Atomic R&D, Ruđer Bošković Institute, Bijenička 54, 10000 Zagreb, Croatia
3SAXS Beamline, Elettra-Sincrotrone Trieste S.C.p.A., Strada Statale 14-km 163, 5 in AREA Science Park, 34149 Basovizza, Italy

Received 3 August 2012; Revised 24 December 2012; Accepted 21 January 2013

Academic Editor: Claude Estournès

Copyright © 2013 M. Lučić Lavčević et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


We report a grazing-incidence small-angle X-ray scattering study of ZnO films with vertically aligned and randomly distributed nanowires, grown through a hydrothermal growth process on nanostructured ZnO seeding coatings and deposited by electron beam evaporation on silicon and glass, respectively. The comparison of the scattering patterns of seeding coatings and nanowires showed that the scattering of vertically aligned nanowires exhibited a specific feature: the dominant characteristic of their scattering patterns is the appearance of fine structure effects around the specular peak. These effects were clarified by the combined reflection and scattering phenomena, suggested for the aligned nanowires-substrate system. Furthermore, they enabled the calculation of the average gyration radius of nanowires in horizontal direction. The calculated value was in good agreement with the radii of nanowires estimated by surface electron microscopy. Therefore, the observed feature in the scattering pattern can serve as evidence of the aligned growth of nanowires.