Journal of Nanomaterials / 2013 / Article / Fig 5

Research Article

A Grazing-Incidence Small-Angle X-Ray Scattering View of Vertically Aligned ZnO Nanowires

Figure 5

FE-SEM images of the ZnO nanowires: (a) W1, on coated silicon, and (b) W2, on coated glass. Top figures (a) and (b) are recorded with 10 000 magnification and 5 kV electron beam. Bottom figures (a) and (b) are recorded with 33 000 and 30 000 magnification, respectively.

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