A Grazing-Incidence Small-Angle X-Ray Scattering View of Vertically Aligned ZnO Nanowires
FE-SEM images of the ZnO nanowires: (a) W1, on coated silicon, and (b) W2, on coated glass. Top figures (a) and (b) are recorded with 10 000 magnification and 5 kV electron beam. Bottom figures (a) and (b) are recorded with 33 000 and 30 000 magnification, respectively.
Article of the Year Award: Outstanding research contributions of 2020, as selected by our Chief Editors. Read the winning articles.