Research Article

Wearout Reliability and Intermetallic Compound Diffusion Kinetics of Au and PdCu Wires Used in Nanoscale Device Packaging

Figure 10

Plots of thicknesses of intermetallic compound (IMC) against aging time of Au wire (a) and PdCu wire (b) used in 110 nm device packaging (c) Plot of against for determination of values.
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(a)
486373.fig.0010b
(b)
486373.fig.0010c
(c)