Research Article

The Analytical Transmission Electron Microscopy: A Powerful Tool for the Investigation of Low-Dimensional Carbon Nanomaterials

Figure 15

TEM image of a HOPG flake (a). The white circle shows the point from where the NED (inset) and the C-K edge spectrum (b) are taken.
506815.fig.0015a
(a)
506815.fig.0015b
(b)