Figure 3: (a) MWCNT removal efficiency of SDS, SDBS, CaCl2, gum arabic (GA), water, and dry wiping as discussed in Section 3. (b) Sample SEM image of the surface of multiwalled carbon nanotubes deposited silicon wafers before cleaning (AD = 36%) and after wipe cleaning with pure water (AD = 12.5%), gum Arabic (AD = 8.5%), and SDBS surfactant (AD = 1.5%). The average precleaning areal density was approximately 34% for all samples.