Research Article

Thermal Effect on the Structural, Electrical, and Optical Properties of In-Line Sputtered Aluminum Doped Zinc Oxide Films Explored with Thermal Desorption Spectroscopy

Table 1

The (002) peak location and full width at half maximum of X-ray diffraction spectra of the AZO films deposited at room temperature (RT), 100°C, and 200°C before and after measuring TDS.

Substrate temperature FWMH
BeforeAfterBeforeAfter

RT34.70°34.25°0.35°0.32°
100°C34.54°34.20°0.40°0.44°
200°C34.56°34.20°0.45°0.36°