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Journal of Nanomaterials
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Journal of Nanomaterials
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2014
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Article
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Fig 4
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Research Article
The Si Nanocrystal Trap Center Studied by Deep Level Transient Spectroscopy (DLTS)
Figure 4
DLTS spectra of MOS sample containing Si NCs dependent on fitting pulse bias: as the pulse bias is rising, the transient signal rises too until saturation.