Deformation of Ordered Mesoporous Silica Structures on Exposure to High Temperatures

Table 1

Values for unit cell parameters (), interplanar spacings (), pore width (), and pore wall thickness () obtained using the method indicated (BJH, SAXS, and TEM) for the samples indicated. All values are in nm. Values of are calculated from the corresponding value. Miller indices are given in italics below each value of .

Sample
S-AP	8.4	9.8; (100)	5.9; (210)	5.1; (100)^a	11.3	11.7	11.8	9.5; (100)	7.5	2.2
S-900	6.2	7.8; (100)	4.1; (210)	3.1; (100)^a	8.8	8.2	7.0	8.5; (100)	5.5	2.2
K-AP	8.6	8.9; (211)	5.4; (400)	4.7; (332)	21.8	21.5	22.0	8.3; (211)	7.0	2.8
K-900	5.9	7.2; (211)	4.4; (400)	3.8; (332)	17.7	17.7	18.1	7.3; (211)	5.5	4.5
F-AP	8.6	11.7; (111)	6.7; (220)	—	20.3	18.8	—	12.1; (111)	9.4	4.7
F-900	—	10.6; (111)	6.5; (220)	—	18.4	18.3	—	—	—	—

Second order diffraction.