Graphene and Other 2D Material Components Dynamic Characterization and Nanofabrication at Atomic Scale

Figure 5

In situ fabrication of suspended molybdenum-sulfide subnanometer ribbons. (a) A few layer MoS₂ flake on transmission electron microscope (TEM) grid. The thinnest region locates at the region labeled by arrow. The scale bar is 100 μm. (b) TEM images of the thinnest region. The thickness of the membrane can be determined by fringe counting at the edge. The straight edge verifies that the membrane is single layer. The folded and unfolded region can be further determined by contrast. The scale bar is 100 nm. (c) High resolution TEM data obtained on the unfolded regions. The corresponding fast Fourier transformation (FFT) image is shown in the inset. (d) The initial MoS₂ membrane with small irradiation-induced vacancies as highlighted by the arrows. (e-f) Larger holes extended from the small vacancies upon 80 kV electron irradiation of another 108 and 261 seconds. (g–l) Time series of the formation and growth for a suspended subnanometer ribbon under 80 kV electron irradiation. The scale bars in (c–l) are 2 nm [24].