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Journal of Nanomaterials
Volume 2015, Article ID 790508, 8 pages
http://dx.doi.org/10.1155/2015/790508
Research Article

Size Measurement of Nanoparticle Assembly Using Multilevel Segmented TEM Images

1Department of Electrical and Computer Engineering, Naresuan University, Phitsanulok 65000, Thailand
2Molecular Research Unit, School of Science, Walailak University, Nakhon Si Thammarat 80161, Thailand

Received 16 November 2014; Accepted 5 January 2015

Academic Editor: Subrata Kundu

Copyright © 2015 Paisarn Muneesawang and Chitnarong Sirisathitkul. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Abstract

Multilevel image segmentation is demonstrated as a rapid and accurate method of quantitative analysis for nanoparticle assembly in TEM images. The procedure incorporating K-means clustering algorithm and watershed transform is tested on transmission electron microscope (TEM) images of FePt-based nanoparticles whose diameters are less than 5 nm. By solving the nanoparticle segmentation and separation problems, this unsupervised method is useful not only in the nonoverlapping case but also for agglomerated nanoparticles. Furthermore, the method exhibits scale invariance based on comparable results from images of different magnifications.