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Journal of Nanomaterials
Volume 2015 (2015), Article ID 970545, 11 pages
http://dx.doi.org/10.1155/2015/970545
Research Article

The Role of Edge Dislocations on the Red Luminescence of ZnO Films Deposited by RF-Sputtering

1Department of Materials Science and Metallurgical Engineering and Inorganic Chemistry, University of Cádiz, Puerto Real, 11510 Cádiz, Spain
2Institute of Research on Electron Microscopy and Materials of the University of Cádiz (IMEYMAT), Puerto Real, 11510 Cádiz, Spain
3Department of Physic and I3N, University of Aveiro, Campus of Santiago, 3810-193 Aveiro, Portugal
4Department of Physics, CICECO, University of Aveiro, 3810-193 Aveiro, Portugal
5Instituto Superior Técnico (IST), Campus Tecnológico e Nuclear, Estrada Nacional 10, Bobadela, 2695-066 Loures, Portugal

Received 28 July 2015; Accepted 8 November 2015

Academic Editor: Run-Wei Li

Copyright © 2015 Rocío Félix et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Rocío Félix, Marco Peres, Sergio Magalhães, et al., “The Role of Edge Dislocations on the Red Luminescence of ZnO Films Deposited by RF-Sputtering,” Journal of Nanomaterials, vol. 2015, Article ID 970545, 11 pages, 2015. doi:10.1155/2015/970545