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Journal of Nanomaterials
Volume 2017, Article ID 3501903, 8 pages
Research Article

Physical Properties Investigation of Reduced Graphene Oxide Thin Films Prepared by Material Inkjet Printing

1Faculty of Chemistry, Brno University of Technology, Purkynova 118, 612 00 Brno, Czech Republic
2Institute of Physics, Academy of Sciences Czech Republic v. v. i., Na Slovance 2, 182 21 Prague 8, Czech Republic
3Danubia NanoTech, s.r.o., Ilkovicova 3, 841 04 Bratislava, Slovakia

Correspondence should be addressed to Veronika Schmiedova; zc.tuv.hcf@avodeimhcscx

Received 23 March 2017; Revised 12 July 2017; Accepted 19 July 2017; Published 23 August 2017

Academic Editor: Zainovia Lockman

Copyright © 2017 Veronika Schmiedova et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


The article is focused on the study of the optical properties of inkjet-printed graphene oxide (GO) layers by spectroscopic ellipsometry. Due to its unique optical and electrical properties, GO can be used as, for example, a transparent and flexible electrode material in organic and printed electronics. Spectroscopic ellipsometry was used to characterize the optical response of the GO layer and its reduced form (rGO, obtainable, for example, by reduction of prepared layers by either annealing, UV radiation, or chemical reduction) in the visible range. The thicknesses of the layers were determined by a mechanical profilometer and used as an input parameter for optical modeling. Ellipsometric spectra were analyzed according to the dispersion model and the influence of the reduction of GO on optical constants is discussed. Thus, detailed analysis of the ellipsometric data provides a unique tool for qualitative and also quantitative description of the optical properties of GO thin films for electronic applications.