Nanostructured CeO₂ Thin Films Prepared by the Sol-Gel Dip-Coating Method with Anomalous Behavior of Crystallite Size and Bandgap

Figure 1

XRD patterns of the CeO₂ films annealed at different temperatures. The left inset shows the shift toward larger 2θ values of the (111) reflection when increases. The right inset exhibits how the interplanar spacing (IS) of lattice along the (111) and (002) directions shrinks with .