Journal of Nanomaterials

Testing, Measurement, and Characterization of Nanomaterials


Publishing date
19 Jun 2015
Status
Published
Submission deadline
30 Jan 2015

Lead Editor

1University of Electronic Science and Technology of China, Chengdu, China

2Binghamton University, State University of New York (SUNY), Binghamton, USA

3Lehigh University, Bethlehem, USA

4North Carolina State University, Raleigh, USA


Testing, Measurement, and Characterization of Nanomaterials

Description

Characterization of materials at the nanoscale has recently attracted significant attention due to the emergence of various novel nanoscale materials and structures over the past decade. Nanomaterials have shown great potential in a broad range of applications from nanocomposites to nanoelectronics and nanoelectromechanical systems (NEMS). Before the prevailing applications of these nanostructures, it is of particular relevance to well understand their mechanical, electrical, thermal, optical, and biological properties. However, due to the very small size of particles/grains, they have presented new challenges during testing, measurement, and characterization of their properties.

We invite investigators to contribute original research articles as well as review articles that will stimulate the developing of novel techniques to test and characterize nanomaterials. We are particularly interested in articles describing the new techniques to characterize the properties of bioinspired nanomaterials.

Potential topics include, but are not limited to:

  • In situ electromechanical testing of nanowires and nanotubes
  • In vivo characterization of bionanomaterals
  • Measurement of the thermal properties of nanomaterials
  • Optical characterization of nanomaterials
  • AFM based nanoscale testing
  • Nanomanipulation of structures and objects
  • Nanoindentation
  • TEM and HRTEM
  • Other characterization and testing methods of nanomaterials

Articles

  • Special Issue
  • - Volume 2015
  • - Article ID 751698
  • - Editorial

Testing, Measurement, and Characterization of Nanomaterials

Bei Peng | Changhong Ke | ... | Yong Zhu
  • Special Issue
  • - Volume 2015
  • - Article ID 167569
  • - Research Article

Impact of NiOx Buffer Layers on the Dielectric Properties of BaTiO3 Thin Films on Nickel Substrates Fabricated by Polymer Assisted Deposition

Hui Du | Yang Li | ... | Yuan Lin
  • Special Issue
  • - Volume 2015
  • - Article ID 627650
  • - Research Article

Mg Doping Effect on the Microstructural and Optical Properties of ZnO Nanocrystalline Films

San-Lin Young | Ming-Cheng Kao | ... | Chun-Han Chen
  • Special Issue
  • - Volume 2015
  • - Article ID 897142
  • - Research Article

Low-Temperature Sintering Bonding Using Silver Nanoparticle Paste for Electronics Packaging

Wei Guo | Zhi Zeng | ... | Shanping Tang
  • Special Issue
  • - Volume 2015
  • - Article ID 836761
  • - Research Article

Magnetization Reversal and Specific Loss Power of Magnetic Nanoparticles in Cellular Environment Evaluated by AC Hysteresis Measurement

Satoshi Ota | Tsutomu Yamada | Yasushi Takemura
  • Special Issue
  • - Volume 2015
  • - Article ID 961924
  • - Research Article

Changes in Nanoscaled Mechanical and Rheological Properties of Asphalt Binders Caused by Aging

Ben Liu | Junan Shen | Xuyan Song
  • Special Issue
  • - Volume 2015
  • - Article ID 391850
  • - Research Article

Preparation of Homogeneous Nanostructures in 5 Minutes for Cancer Cells Capture

Lixue Wang | Chuandong Zhu | ... | Xia He
  • Special Issue
  • - Volume 2015
  • - Article ID 740984
  • - Research Article

Butterfly-Inspired 2D Periodic Tapered-Staggered Subwavelength Gratings Designed Based on Finite Difference Time Domain Method

Houxiao Wang | Wei Zhou | ... | Rakesh Ganpat Mote
  • Special Issue
  • - Volume 2015
  • - Article ID 359696
  • - Research Article

Frontal Cryosectioning: An Improved Protocol for Sectioning Large Areas of Fibrous Scaffolds

Casey P. Grey | David G. Simpson
  • Special Issue
  • - Volume 2015
  • - Article ID 253062
  • - Research Article

A Slope-Adapted Sample-Tilting Method for Profile Measurement of Microstructures with Steep Surfaces

Hui Fang | Bin Xu | ... | Shiping Zhao
Journal of Nanomaterials
 Journal metrics
Acceptance rate49%
Submission to final decision69 days
Acceptance to publication29 days
CiteScore3.800
Journal Citation Indicator0.310
Impact Factor2.986
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