Journal of Nanotechnology / 2012 / Article / Tab 3 / Review Article
A Review on Aerosol-Based Direct-Write and Its Applications for Microelectronics Table 3 Summary of literature for drag coefficients at different Reynolds numbers, reprinted from Clift et al. [
56 ], Copyright 2005, with permission from Dover Publications, Inc.
Author(s) Reynolds number range
𝐶
𝐷
Schiller and Nauman
R
e
𝑝
<
8
0
0
(
2
4
/
R
e
𝑝
)
(
1
+
0
.
1
5
R
e
𝑝
0
.
6
8
7
)
Lapple
R
e
𝑝
<
1
0
0
0
(
2
4
/
R
e
𝑝
)
(
1
+
0
.
1
2
5
R
e
𝑝
0
.
7
2
)
Langmuir and Blodgett
1
<
R
e
𝑝
<
1
0
0
(
2
4
/
R
e
𝑝
)
(
1
+
0
.
1
9
7
R
e
𝑝
0
.
6
3
+
2
.
6
×
1
0
−
4
R
e
𝑝
1
.
3
8
)
Allen
2
<
R
e
𝑝
<
5
0
0
1
0
R
e
𝑝
−
1
/
2
Allen
1
<
R
e
𝑝
<
1
0
0
0
3
0
R
e
𝑝
−
0
.
6
2
5
Gilbert et al.
0
.
2
<
R
e
𝑝
<
2
0
0
0
0
.
4
8
+
2
8
R
e
𝑝
−
0
.
8
5
Kurten et al.
0
.
1
<
R
e
𝑝
<
4
0
0
0
0
.
2
8
+
6
/
R
e
𝑝
0
.
5
+
2
1
/
R
e
𝑝
Abraham
R
e
𝑝
<
6
0
0
0
0
.
2
9
2
4
(
1
+
9
.
0
6
R
e
𝑝
−
0
.
5
)
2
Ihme et al.
R
e
𝑝
<
1
0
4
0
.
3
6
+
5
.
4
8
/
R
e
𝑝
0
.
5
7
3
+
2
4
/
R
e
𝑝
Rumpf
R
e
𝑝
<
1
0
2
+
2
4
/
R
e
𝑝
Rumpf
R
e
𝑝
<
1
0
0
1
+
2
4
/
R
e
𝑝
Rumpf
R
e
𝑝
<
1
0
5
0
.
5
+
2
4
/
R
e
𝑝
Clift and Gauvin
R
e
𝑝
<
3
×
1
0
5
(
2
4
/
R
e
𝑝
)
(
1
+
0
.
1
5
R
e
𝑝
0
.
6
8
7
)
+
(
0
.
4
2
/
(
1
+
4
.
2
5
×
1
0
4
R
e
𝑝
−
1
.
1
6
)
)
Brauer
R
e
𝑝
<
3
×
1
0
5
0
.
4
+
4
/
R
e
𝑝
0
.
5
+
2
4
/
R
e
𝑝
Tanaka and Iinoya
R
e
𝑝
<
7
×
1
0
5
l
o
g
1
0
𝐺
=
𝑎
1
𝑤
2
+
𝑎
2
𝑤
+
𝑎
3
,
𝑤
=
l
o
g
1
0
R
e
𝑝
