GISAXS/GIXRD View of ZnO Films with Hierarchical Structural Elements

Table 3

Average nanocrystal sizes, 𝐿(ℎ𝑘𝑙), estimated from (100), (002), and (101) reflections, from conventional XRD measurements.

Sample	𝐿(100)/nm	𝐿(002)/nm	𝐿(101)/nm
A	12	12	11
B	14	18	14
C	13	/	11