Journal of Nanotechnology / 2012 / Article / Fig 7

Review Article

Study of Carbon Nanotube-Substrate Interaction

Figure 7

The EFM profiles for semiconducting and metallic SWNTs. In column (a), the effect of the EFM tip crossing a semiconductor (blue) and a metallic (red) SWNTs on Δ 𝜔 is shown. The lineshapes are different due to the differences in dielectric response. In column (b) the effect of the EFM tip retracting from the substrate on Δ 𝜔 is shown. Here the effect is the same for both semiconductors and metals. In column (c) the two effects are combined. The equations in [57] were used to build these plots [30].

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