Journal of Nanotechnology / 2012 / Article / Fig 8

Review Article

Study of Carbon Nanotube-Substrate Interaction

Figure 8

(a) Electric force microscopy (EFM) image of the same SWNT serpentine discussed in Figure 6. (b) Scanning across the SWNT, the cantilever frequency shift is different if a tube is semiconducting (“W shaped” blue line) or metallic (“V shaped” red line) [57]. The red and blue lines in (a) indicate the two regions where these profiles in (b) were acquired [30].

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