Journal of Nanotechnology / 2012 / Article / Fig 3

Research Article

Relationship between Length and Surface-Enhanced Raman Spectroscopy Signal Strength in Metal Nanoparticle Chains: Ideal Models versus Nanofabrication

Figure 3

(a) Silicon substrate immediately after FIB milling of SiO2 layer. (b) Illustration of three-phase contact line dragging nanoparticles across the substrate surface. (c) Close-up illustration of particles pushed into milled trenches via the capillary force. (d) Array of nanosphere trimers after deposition is complete.
840245.fig.003a
(a)
840245.fig.003b
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840245.fig.003c
(c)
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