Relationship between Length and Surface-Enhanced Raman Spectroscopy Signal Strength in Metal Nanoparticle Chains: Ideal Models versus Nanofabrication
Figure 3
(a) Silicon substrate immediately after FIB milling of SiO2 layer. (b) Illustration of three-phase contact line dragging nanoparticles across the substrate surface. (c) Close-up illustration of particles pushed into milled trenches via the capillary force. (d) Array of nanosphere trimers after deposition is complete.
