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Journal of Nanotechnology
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2014
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Article
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Fig 2
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Review Article
Silicon Nanofabrication by Atomic Force Microscopy-Based Mechanical Processing
Figure 2
AFM profiles of silicon square areas processed by diamond tip sliding for different tip radii. (a) 50, (b) 200, and (c) 100 nm.
(a)
Remove groove processed with a 50 nm radius tip
(b)
Protuberance profile processed with a 200 nm radius tip
(c)
Removal and protuberance profile of silicon with a 100 nm radius tip