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Journal of Nanotechnology
Volume 2015, Article ID 686021, 7 pages
Research Article

Influence of OH Ion Concentration on the Surface Morphology of ZnO-SiO2 Nanostructure

Materials Science Laboratory, Physics Department, College of Science and Mathematics, Mindanao State University-Iligan Institute of Technology, A. Bonifacio Avenue, Tibanga, 9200 Iligan, Philippines

Received 23 July 2015; Revised 2 September 2015; Accepted 3 September 2015

Academic Editor: Yuxin Zhao

Copyright © 2015 Jessica Ven G. Tinio et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


The influence of varying OH ion concentration on the surface morphology of chemically deposited ZnO-SiO2 nanostructures on glass substrate was investigated. The morphological features, phase structure, and infrared characteristics were examined by scanning electron microscopy (SEM), X-ray diffraction (XRD), and Fourier transform infrared spectroscopy (FTIR), respectively. Results revealed that silica significantly changes the hexagonal morphology of bare ZnO rod to “pointed tips” when using low initial OH precursor concentration. Increasing OH ion concentration resulted in a “flower-like” formation of ZnO-SiO2 and a remarkable change from “pointed tips” to “hemispherical tips” at the top surface of the rods. The surface capping of SiO2 to ZnO leads to the formation of these “hemispherical tips.” The infrared spectroscopic analysis showed the characteristics peaks of ZnO and SiO2 as well as the Si-O-Zn band which confirms the formation of ZnO-SiO2. Phase analysis manifested that the formed ZnO-SiO2 is of wurtzite structure. Furthermore, a possible growth mechanism is proposed based on the obtained results.