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Journal of Nanotechnology
Volume 2018 (2018), Article ID 2934268, 6 pages
Research Article

A Glitch-Free Novel DET-FF in 22 nm CMOS for Low-Power Application

1College of Engineering and Technology, Mody University of Science and Technology, Lakshmangarh, Sikar, Rajasthan 332311, India
2NSHM Knowledge Campus, Durgapur, West Bengal, India

Correspondence should be addressed to Sumitra Singar; moc.liamg@ragnis8891artimus

Received 21 November 2017; Accepted 4 February 2018; Published 29 March 2018

Academic Editor: Marco Rossi

Copyright © 2018 Sumitra Singar et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Sumitra Singar, N. K. Joshi, and P. K. Ghosh, “A Glitch-Free Novel DET-FF in 22 nm CMOS for Low-Power Application,” Journal of Nanotechnology, vol. 2018, Article ID 2934268, 6 pages, 2018. doi:10.1155/2018/2934268