Table of Contents
International Journal of Quality, Statistics, and Reliability
Volume 2008, Article ID 594753, 10 pages
http://dx.doi.org/10.1155/2008/594753
Research Article

A Unified Approach for Predicting Long- and Short-Term Capability Indices with Dependence on Manufacturing Target Bias

Department of Electrical Engineering, The University of Texas at Tyler, Tyler, TX 75799, USA

Received 15 April 2008; Revised 25 September 2008; Accepted 14 December 2008

Academic Editor: Satish Bukkapatnam

Copyright © 2008 Nikhil T. Satyala and R. J. Pieper. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Abstract

It is shown that the exact solution for the capability index (CPI) for Gaussian-distributed process with target bias can be expressed in terms of an unbiased CPI and a normalized target bias. The principal advantage of this specific formulation is that it facilitates evaluation of the degradation of the capability of the process due to bias between process mean and the process target. It is shown how this formalism, initially developed for the short-term process, is readily extended to long-term process for which the distribution is Gaussian. Readily isolated in the latter case are the two long-term CPI degrading effects, namely, process instability and target bias. Sufficient conditions to guarantee that long-term processes are distributed as Gaussian are discussed. Within the context of these assumed conditions, a new paradigm for a long-term locator ‘‘’’ is proposed. For a three sigma process the results indicate that the exact CPI model is a less pessimistic predictor than both of the industry CPI models tested.