Table of Contents
International Journal of Quality, Statistics, and Reliability
Volume 2011, Article ID 396297, 8 pages
Research Article

Quality Assessment of Transient Response Analysis Method for Detecting Radiation-Induced Faults

1Mechatronics Research Group, Universidad Tecnológica Nacional, Avenida Universidad 450, 5900 Villa María, Argentina
2Electronics and Instrumentation Development Group, Universidad Nacional de Córdoba, Medina Allende S/N, 5000 Córdoba, Argentina

Received 17 January 2011; Revised 12 June 2011; Accepted 23 June 2011

Academic Editor: Suk joo Bae

Copyright © 2011 José Peralta et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


We evaluate the ability of transient response analysis method (TRAM), a simple test strategy proposed for filters, to detect deviations in circuit specifications beyond established limits. Particularly, we focus our attention on deviations produced by displacement damage in integrated resistors. This damage is produced by the impact of high-energy particles like the encountered in space environments. For this purpose, we formulate a simple deviation-fault model that takes into consideration the degradation addressed. Additionally, more transient response parameters are taken into account in order to improve the fault coverage. We adopt for our evaluations two typical second-order filters as cases of study. For these filters, the simulation results show that TRAM reaches excellent fault coverage for both filters, suggesting that its use in space applications is encouraging.