Journal of Sensors / 2015 / Article / Fig 5

Research Article

Effect of the Tip Size on AFM Cantilever Based Force Sensor

Figure 5

Cell detachment demonstration by the backside of AFM cantilever. (a1–a7) SEM images of the cell detachment process. (b) Deformation of the AFM cantilever beam, corresponding to (a7). (c) Deformation of the cell in the detachment process. The cell is pressed rather than moved on the substrate.

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