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Journal of Sensors
Volume 2016 (2016), Article ID 1350750, 7 pages
Research Article

Feature Coverage Indexes for Dual Homography Estimation in Constructing Panorama Image

1Department of Embedded Systems Engineering, University of Incheon, Incheon 406-772, Republic of Korea
2Department of Entertainment Engineering and Design, University of Nevada, Las Vegas, NV 89154, USA

Received 24 January 2015; Accepted 21 March 2015

Academic Editor: Wei Wu

Copyright © 2016 Kyungkoo Jun and Sijung Kim. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


Enlarged images can be obtained by various methods. Stitching is one of the efficient methods. It can produce panoramic images by stitching adjacent images which contain overlapping regions even though they are obtained through separate image sensors. Images that contain multiple different planes are hard to be stitched together because each plane has a different homography matrix for perspective warping. For this, a dual homography was proposed. However its performance varies depending on feature detectors which are used to find matching feature points between images. In this paper, we propose three feature coverage indexes which evaluate the stitching performance of feature detectors and predict the outcomes of the stitching. We evaluate four well-known feature detectors by the proposed indexes by applying them to the image stitching process and show that the prediction by the index values coincides with the stitching results.