Journal of Sensors / 2016 / Article / Fig 2

Research Article

Lithography-Free, Low-Cost Method for Improving Photodiode Performance by Etching Silicon Nanocones as Antireflection Layer

Figure 2

(a) Comparison of 3-inch blackened silicon (left) and polished silicon wafer (right). (b) Treated (left) and untreated (right) photodiode taped on a piece of glass slide. (c) Cross-sectional SEM image of blackened photodiode. (d) Effective refractive index of nanocone forest and the light path from air to silicon with nanocone structure, the reflection of light is minimal at each depth of the sample. (e) Schematic to show the effective refractive index of nanocone array on black silicon.

We are committed to sharing findings related to COVID-19 as quickly as possible. We will be providing unlimited waivers of publication charges for accepted research articles as well as case reports and case series related to COVID-19. Review articles are excluded from this waiver policy. Sign up here as a reviewer to help fast-track new submissions.