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Journal of Spectroscopy
Volume 2013 (2013), Article ID 307824, 6 pages
http://dx.doi.org/10.1155/2013/307824
Research Article

Optical Characterization of Porous Sputtered Silver Thin Films

1Laboratoire de Physique de la Matière Condensée, Université de Picardie Jules Verne, 33 rue Saint Leu, 80039 Amiens Cedex 1, France
2Laboratoire de Mécanique Roberval, Université de Technologie de Compiègne, Centre de Recherches de Royallieu, 60203 Compiègne Cedex, France

Received 15 May 2013; Revised 9 September 2013; Accepted 10 September 2013

Academic Editor: Damien Boyer

Copyright © 2013 Olivier Carton et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Abstract

The optical properties of various porous silver films, grown with a commercial DC sputter coater, were investigated and compared for different plasma parameters. Effective Drude models were successfully used for those films whose spectra did not show particular resonance peaks. For the other films, neither an effective Drude model nor effective medium models (Maxwell Garnett, Bruggeman, and Looyenga) can describe the optical properties. It turns out that a more general approach like the Bergman representation describes the optical data of these films accurately adopting porosity values consistent with physical measurements.