A Comparison of Modifications Induced by Li³⁺ and Ag¹⁴⁺ Ion Beam in Spectroscopic Properties of Bismuth Alumino-Borosilicate Glass Thin Films

Figure 1

The X-ray diffraction patterns of the Ag¹⁴⁺ ion-irradiated BBiSA glass thin films: (a) unirradiated; (b) 1×10¹² ions/cm²; (c) 5×10¹² ions/cm²; (d) 1×10¹³ ions/cm²; (e) 3×10¹³ ions/cm².